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Thickness-Measurement F20
Introduction

F20 series

 

The world's best-selling desktop film thickness measurement system

With the push of a button, you measure thickness and refractive index in less than a second at the same time.

Setup is as simple as plugging the device into the USB port on your Windows™ running computer and connecting to the sample platform. The F20 has been used in thousands of applications around the world.

In fact, we are learning more applications from our customers every day.

Choosing F20 mainly depends on the thickness of the film you need to measure (determine the desired wavelength range)


Included content:

  • Integrated spectrometer/light source device
    FILMeasure 8 software
    FILMeasure Independent Software (for remote data analysis)
    SS-3 sample platform
    Reference material
    Thickness standard
    Leveling filter (for high reflection substrate)
    Spare lamp

 

Model and specification

型號 厚度範圍* 波長範圍
F20 15nm - 70μm 380-1050nm
F20-EXR 15nm - 250μm 380-1700nm
F20-NIR 100nm - 250μm 950-1700nm
F20-UV 1nm - 40μm 190-1100nm
F20-UVX 1nm - 250μm 190-1700nm
F20-XT 0.2μm - 450μm 1440-1690nm
F3-sX 系列 10μm - 3mm 960-1580nm
*Depends on the film type



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In order to pursue the excellent quality of our products, we continually develop manufacturing technology. A superior testing environment was created to guarantee high accuracy and quality of each our provided equipment. Besides, we constantly focus on improving the manufacturing process to increase efficiency and productivity, and to reduce production cost. We, therefore, are able to immeditately respond to customers’ needs with highly competitive products.

CONTACT

M&R Nano Technology Co., LTD. : No. 10, Lane 863, Gaoshi Road, Yangmei District, Taoyuan City
M&R Nano Technology (Dongguan) Co., LTD. : No. 239-7, Middle Dezheng Road, Xianxi Community, Chang 'an Town, Dongguan City

400-699-2885

sam@mrnanotec.com

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