The world's best performance large sample stage AFM
Bruker Dimension® Icon™ Atomic Force Microscope brings a new application experience to researchers in the nano field of industry and scientific research, with a high level of performance, functions and accessories selection, powerful testing functions and easy operation.
Gathering decades of technical experience in the Dimension system, customer feedback, and combining the equipment needs of the industrial field, Dimension Icon has undergone a comprehensive innovation. The new system design achieves unprecedented low drift and low noise level. Now, users only need a few minutes to obtain a true and accurate scan image.
The excellent resolution of Dimension® Icon™, combined with Bruker's unique electronic scanning algorithm, significantly improves the measurement speed and quality.
Dimension® Icon™ is the latest innovation in tip scanning technology that has been leading the way.
The system is equipped with a temperature-compensated position sensor, which achieves sub-Angstrom-level Z-axis and XY-axis angstrom-level low noise levels. Applying this performance to a 90-micron scanning range and large sample stage system, the effect even exceeds that of a high-resolution atomic force microscope. Open loop noise level.
The new design of the XYZ closed-loop scanning head enables the instrument to work at a higher scanning speed without loss of image quality, enabling greater data acquisition output.
Equipped with Bruker's patented PeakForce® technology, Dimension Icon can intelligently acquire high-resolution images.
Dimension Icon Dimension Icon introduces the latest technology on the original operating platform, exhibiting higher performance and faster measurement speed.
The software's intuitive workflow makes operation easier than with previous state-of-the-art AFM techniques.
Dimension Icon users can immediately obtain high-quality measurement results without the need for hours of professional parameter adjustment as before.
Every aspect of the Dimension Icon, from the completely open tip sample volume, to the software parameter presets, has been specifically designed for hassle-free operation and amazing AFM ease-of-use.
Dimension Icon demonstrates unrivaled performance, stability and flexibility, enabling virtually all measurements previously only possible in purpose-built systems. Utilizing an open platform, large or multiple sample holders and many easy-to-use features, the powerful functions of AFM are fully displayed in front of researchers in the scientific and industrial fields, setting a new standard for high-quality AFM imaging and nanomanipulation.
Dimension Icon offers a flexible platform with no performance impact, one platform, endless possibilities:
With an outstanding set of AFM imaging modes, Bruker can provide you with the right AFM technique for every research.
Based on the core imaging modes (contact mode and tapping mode), Bruker provides a full set of AFM test modes, allowing users to probe the electrical, magnetic and other rich properties of the sample. As a new core imaging mode, Bruker's original new peak force tapping technology has been applied to a variety of measurement modes, which can simultaneously provide morphology, electrical and mechanical performance data.