Great value high performance AFM

Featuring Bruker's patented PeakForce Tapping ® technology, the Dimension Edge™ AFM offers the highest level of atomic force microscope (AFM) performance, functionality and accessories in its class. Developed based on the Dimension Icon platform, the Dimension Edge system is designed with the characteristics of low drift and low noise, which greatly improves the speed and reliability of data acquisition. With this brand new instrument, high-quality, publishable professional data can be obtained in a few minutes. data. In addition, its integrated visual feedback and pre-configured settings make it as simple and convenient as an expert's on-site operation, and the measurement results are highly consistent. Dimension Edge's state-of-the-art large-sample AFM capabilities and technologies provide options for each user's diverse application environments.

Closed loop accuracy

The core component of the system is Bruker's famous closed-loop scanner. The scanner uses a temperature-compensated position sensor driven by modularly designed low-noise control electronics that reduces the closed-loop noise level of probe scanning to the order of the length of a single chemical bond.

Large sample platform

Not only is the Dimension Edge sample stage motorized and programmable for efficient multi-point measurement, it also allows you to place more types of samples simultaneously directly under the AFM scanner, reducing sample placement time. The physical openness of the probe-sample junction allows you to more directly observe the geometry of the sample device, as well as the electrical connections of the device or place other custom experimental accessories.

Automatic Image Optimization

Not only is the Dimension Edge sampling stage motorized and programmable for efficient multi-point measurement, it also allows you to fit more types of samples directly under the AFM scanner while using less preparation time. Physically open access to the probe-sample junction enables more direct investigation of geometrically challenging device structures, as well as attachment of electrical connections or other custom experimental accessories.

Expand Your Applications with AFM

With an outstanding set of AFM imaging modes, Bruker can provide you with the right AFM technique for every research.

Based on the core imaging modes (contact mode and tapping mode), Bruker provides a full set of AFM test modes, allowing users to probe the electrical, magnetic and other rich properties of the sample. As a new core imaging mode, Bruker's original new peak force tapping technology has been applied to a variety of measurement modes, which can simultaneously provide morphology, electrical and mechanical performance data.